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  march 2011 ?2011 fairchild semiconductor corporation FDMS4435BZ rev.c3 www.fairchildsemi.com 1 FDMS4435BZ p-channel power trench ? mosfet FDMS4435BZ p-channel powertrench ? mosfet -30 v, -18 a, 20 m features ? max r ds(on) = 20 m at v gs = -10 v, i d = -9.0 a ? max r ds(on) = 37 m at v gs = -4.5 v, i d = -6.5 a ? extended v gss range (-25 v) for battery applications ? high performance trench tec hnology for extremely low r ds(on) ? high power and current handling capability ? hbm esd protection level >7 kv typical (note 4) ? 100% uil tested ? termination is lead-free and rohs compliant general description this p-channel mosfet is produced using fairchild semiconductor?s advanced power trench ? process that has been especially tailored to minimi ze the on-state resistance. this device is well suited for power management and load switching applications common in notebook computers and portable battery packs. applications ? high side in dc-dc buck converters ? notebook battery power management ? load switch in notebook bottom power 56 top pin 1 g s s s d d d d 4 3 2 1 g s s s d d d d 5 6 7 8 mosfet maximum ratings t a = 25 c unless otherwise noted thermal characteristics package marking and ordering information symbol parameter ratings units v ds drain to source voltage -30 v v gs gate to source voltage 25 v i d drain current -continuous (p ackage limited) t c = 25 c -18 a -continuous (silicon limited) t c = 25 c -35 -continuous t a = 25 c (note 1a) -9.0 -pulsed -50 e as single pulse avalanche energy (note 3) 18 mj p d power dissipation t c = 25 c 39 w power dissipation t a = 25 c (note 1a) 2.5 t j , t stg operating and storage junction temperature range -55 to +150 c r jc thermal resistance, junction to case 3.2 c/w r ja thermal resistance, junction to ambient (note 1a) 50 device marking device package reel size tape width quantity FDMS4435BZ FDMS4435BZ power 56 13 ?? 12 mm 3000 units
FDMS4435BZ p-channel powertrench ? mosfet www.fairchildsemi.com 2 ?2011 fairchild semiconductor corporation FDMS4435BZ rev.c3 electrical characteristics t j = 25 c unless otherwise noted off characteristics on characteristics dynamic characteristics switching characteristics drain-source diode characteristics symbol parameter test conditions min typ max units bv dss drain to source breakdown voltage i d = -250 a, v gs = 0 v -30 v bv dss t j breakdown voltage temperature coefficient i d = -250 a, referenced to 25 c -23 mv/c i dss zero gate voltage drain current v ds = -24 v, v gs = 0 v -1 a i gss gate to source leakage current v gs = 25 v, v ds = 0 v 10 a v gs(th) gate to source threshold voltage v gs = v ds , i d = -250 a -1.0 -1.9 -3.0 v v gs(th) t j gate to source threshold voltage temperature coefficient i d = -250 a, referenced to 25 c 6 mv/c r ds(on) static drain to source on resistance v gs = -10 v, i d = -9.0 a 15 20 m v gs = -4.5 v, i d = -6.5 a 22 37 v gs = -10 v, i d = -9.0 a t j = 125 c 21 28 g fs forward transconductance v ds = -5 v, i d = -9.0 a 25 s c iss input capacitance v ds = -15 v, v gs = 0 v, f = 1 mhz 1540 2050 pf c oss output capacitance 290 390 pf c rss reverse transfer capacitance 260 385 pf r g gate resistance 5 t d(on) turn-on delay time v dd = -15 v, i d = -9.0 a, v gs = -10 v, r gen = 6 917ns t r rise time 10 18 ns t d(off) turn-off delay time 35 56 ns t f fall time 19 33 ns q g total gate charge v gs = 0 v to -10 v v dd = -15 v, i d = -9.0 a 34 47 nc q g total gate charge v gs = 0 v to -4.5 v 18 25 nc q gs gate to source charge 5 nc q gd gate to drain ?miller? charge 9 nc v sd source to drain diode forward voltage v gs = 0 v, i s = -1.9 a (note 2) 0.75 1.2 v v gs = 0 v, i s = -9.0 a (note 2) 0.86 1.5 t rr reverse recovery time i f = -9.0 a, di/dt = 100 a/ s 25 39 ns q rr reverse recovery charge 12 21 nc notes : 1. r ja is determined with the device mounted on a 1 in 2 pad 2 oz copper pad on a 1.5 x 1.5 in. board of fr-4 material. r jc is guaranteed by design while r ca is determined by the user's board design. 2. pulse test: pulse width < 300 s, duty cycle < 2.0%. 3. e as of 18 mj is based on starting t j = 25 c, l = 1 mh, i as = -6 a, v dd = -27 v, v gs = -10 v. 100% tested at l = 0.3 mh, i as = -8 a. 4. the diode connected between the gate and source serves only as protection against esd. no gate overvoltage rating is implied . 50 c/w when mounted on a 1 in 2 pad of 2 oz copper a) b) 125 c/w when mounted on a minimum pad of 2 oz copper.
FDMS4435BZ p-channel powertrench ? mosfet www.fairchildsemi.com 3 ?2011 fairchild semiconductor corporation FDMS4435BZ rev.c3 typical characteristics t j = 25 c unless otherwise noted figure 1. 01234 0 10 20 30 40 50 v gs = -6 v v gs = -3.5 v v gs = -10 v v gs = -4 v v gs = -4.5 v pulse duration = 80 p s duty cycle = 0.5% max -i d , drain current (a) -v ds , drain to source voltage (v) on-region characteristics figure 2. 0 1020304050 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 v gs = -4 v v gs = -3.5 v v gs = -6 v pulse duration = 80 p s duty cycle = 0.5% max normalized drain to source on-resistance - i d , drain current (a) v gs = -4.5 v v gs = -10 v n o r m a l i z e d o n - r e s i s t a n c e vs drain current and gate voltage f i g u r e 3 . n o r m a l i z e d o n - r e s i s t a n c e -75 -50 -25 0 25 50 75 100 125 150 0.6 0.8 1.0 1.2 1.4 1.6 i d = - 9 a v gs = -10 v normalized drain to source on-resistance t j , junction temperature ( o c ) vs junction temperature figure 4. 24681 0 0 20 40 60 80 t j = 125 o c i d = -9 a t j = 25 o c -v gs , gate to source voltage (v) r ds(on) , drain to source on-resistance ( m : ) pulse duration = 80 p s duty cycle = 0.5% max o n - r e s i s t a n c e v s g a t e t o source voltage figure 5. transfer characteristics 12345 0 10 20 30 40 50 t j = 25 o c v ds = -5 v pulse duration = 80 p s duty cycle = 0.5% max t j = -55 o c t j = 125 o c -i d , drain current (a) -v gs , gate to source voltage (v) figure 6. 0.00.20.40.60.81.01.21.4 0.001 0.01 0.1 1 10 50 t j = -55 o c t j = 25 o c t j = 125 o c v gs = 0 v -i s , reverse drain current (a) -v sd , body diode forward voltage (v) s o u r c e t o d r a i n d i o d e forward voltage vs source current
FDMS4435BZ p-channel powertrench ? mosfet www.fairchildsemi.com 4 ?2011 fairchild semiconductor corporation FDMS4435BZ rev.c3 figure 7. 0 8 16 24 32 40 0 2 4 6 8 10 i d = -9 a v dd = -20 v v dd = -15 v -v gs , gate to source voltage (v) q g , gate charge (nc) v dd = -10 v gate charge characteristics figure 8. 0.1 1 10 30 100 1000 5000 f = 1 mhz v gs = 0 v capacitance (pf) -v ds , drain to source voltage (v) c rss c oss c iss c a p a c i t a n c e v s d r a i n to source voltage figure 9. 0.01 0.1 1 10 1 10 20 t j = 100 o c t j = 25 o c t j = 125 o c t av , time in avalanche (ms) -i as , avalanche current (a) u n c l a m p e d i n d u c t i v e switching capability figure 10. 25 50 75 100 125 150 0 8 16 24 32 40 package limited r t jc = 3.2 o c/w v gs = -4.5 v v gs = -10 v -i d , drain current (a) t c , case temperature ( o c ) m a x i m u m c o n t i n u o u s d r a i n current vs cate temperature figure 11. 03691215182124273033 10 -10 10 -9 10 -8 10 -7 10 -6 10 -5 10 -4 10 -3 10 -2 10 -1 v gs = 0 v t j = 125 o c t j = 25 o c -v gs , gate to source voltage (v) -i g , gate leakage current (a) g a t e l e a k a g e c u r r e n t v s g a t e t o source voltage f i g u r e 1 2 . f o r w a r d b i a s s a f e op erating area 0.05 0.1 1 10 100 0.01 0.1 1 10 100 this area is limited by r ds(on) 100 p s 1 ms 100 ms 1 s dc 10 s 10 ms single pulse t j = max rated r t ja = 125 o c/w t a = 25 o c -i d , drain current (a) -v ds , drain to source voltage (v) typical characteristics t j = 25 c unless otherwise noted
FDMS4435BZ p-channel powertrench ? mosfet www.fairchildsemi.com 5 ?2011 fairchild semiconductor corporation FDMS4435BZ rev.c3 figure 13. single pulse maximum power dissipation 10 -4 10 -3 10 -2 10 -1 11 0 100 1000 0.5 1 10 100 1000 p (pk) , peak transient power (w) single pulse r t ja = 125 o c/w t a = 25 o c t, pulse width (sec) figure 14. junction-to-ambient transient thermal response curve 10 -4 10 -3 10 -2 10 -1 11 0 100 1000 0.001 0.01 0.1 1 2 single pulse r t ja = 125 o c/w duty cycle-descending order normalized thermal impedance, z t ja t, rectangular pulse duration (sec) d = 0.5 0.2 0.1 0.05 0.02 0.01 p dm t 1 t 2 notes: duty factor: d = t 1 /t 2 peak t j = p dm x z t ja x r t ja + t a typical characteristics t j = 25 c unless otherwise noted
FDMS4435BZ p-channel powertrench ? mosfet www.fairchildsemi.com 6 ?2011 fairchild semiconductor corporation FDMS4435BZ rev.c3 dimensional outlin e and pad layout
7 www.fairchildsemi.com FDMS4435BZ p-channel powertrench ? mosfet ?2011 fairchild semiconductor corporation FDMS4435BZ rev.c3 trademarks the following includes registered and unregistered trademarks and service marks, owned by fairchild semiconductor and/or its gl obal subsidiaries, and is not intended to be an exhaustive list of all such trademarks. *trademarks of system general corporati on, used under license by fairchild semiconductor. disclaimer fairchild semiconductor reserves the right to make changes wi thout further notice to any products herein to improve reliability, function, or design. fairchild does not assume an y liability arising out of the application or use of any product or circuit described herein; neither does it convey any license under its patent rights, nor the rights of others. these specifications do not expand the terms of fairchild?s wo rldwide terms and conditions, specifically the warranty therein, which covers these products. life support policy fairchild?s products are not authorized for use as critical components in life support devices or systems without the express written approval of fai rchild semiconductor corporation. as used here in: 1. life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury of the user. 2. a critical component in any component of a life support, device, or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. product status definitions definition of terms accupower? auto-spm? build it now? coreplus? corepower? crossvolt ? ctl? current transfer logic? deuxpeed ? dual cool? ecospark ? efficentmax? esbc? fairchild ? fairchild semiconductor ? fact quiet series? fact ? fast ? fastvcore? fetbench? flashwriter ? * fps? f-pfs? frfet ? global power resource sm green fps? green fps? e-series? g max ? gto? intellimax? isoplanar? megabuck? microcoupler? microfet? micropak? micropak2? millerdrive? motionmax? motion-spm? optihit? optologic ? optoplanar ? ? pdp spm? power-spm? powertrench ? powerxs? programmable active droop? qfet ? qs? quiet series? rapidconfigure? saving our world, 1mw/w/kw at a time? signalwise? smartmax? smart start? spm ? stealth? superfet ? supersot?-3 supersot?-6 supersot?-8 supremos ? syncfet? sync-lock? ?* the power franchise ? the right technology for your success? ? tinyboost? tinybuck? tinycalc? tinylogic ? tinyopto? tinypower? tinypwm? tinywire? trifault detect? truecurrent?* serdes? uhc ? ultra frfet? unifet? vcx? visualmax? xs? tm ? tm tm datasheet identification product status definition advance information formative / in design datasheet contains the design specifications for product developm ent. specifications may change in any manner without notice. preliminary first production datasheet contains preliminary data; supplementary data will be published at a later date. fairchild semiconductor reserves the ri ght to make changes at any time without notice to improve design. no identification needed full production datasheet contains final specifications. fair child semiconductor reserves the right to make changes at any time withou t notice to improve the design. obsolete not in production datasheet contains specifications on a product that is discontinued by fairchild semiconductor. the datasheet is for reference information only. anti-counterfeiting policy fairchild semiconductor corporation?s anti-counterfeiting policy. fairchild?s anti-counterfeiting policy is also stated on our external website, www.fairchildsemi.com, under sales support . counterfeiting of semiconductor parts is a growing problem in th e industry. all manufactures of semiconductor products are expe riencing counterfeiting of their parts. customers who inadvertently purchase counterfeit parts experience many problems su ch as loss of brand reputation, substa ndard performance, failed application, and increased cost of production and manufacturing de lays. fairchild is taking strong measures to protect ourselve s and our customers from the proliferation of counterfeit parts. fairchild strongly encourages customers to purchase fairchild parts either directly from fa irchild or from authorized fairchild distributors who are listed by country on our web page cited above . products customers buy either from fairchild directly or fr om authorized fairchild distributors are genuine parts, have full traceability, meet fairchild?s quality standards for handing and storage and provide access to fairchild?s full range of up-to-date technical and product information. fairchild and our authorized distributors will stand behind all warranties and wi ll appropriately address and warranty issues that may arise. fairchild will not provide any warranty coverage or other assistance for parts bought from unau thorized sources. fairchild is committed to combat this global problem and encourage our customer s to do their part in stopping th is practice by buying direct or from authorized distributors. rev. i51 ?


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